Understanding Atomic Force Microscope (AFM): Principle, Applications, and Future Scope
An Atomic Force Microscope (AFM) is a powerful analytical tool used to study the surface characteristics of materials at the nanoscale level. Since its invention in the 1980s, AFM has become one of the most widely used instruments in nanotechnology, material science, and life sciences, enabling researchers to visualize, measure, and manipulate materials with atomic-level precision.
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